We are pleased to announce the first xG-ALOE Plugfest 2025, organized in collaboration with Fraunhofer HHI and EANTC. The Plugfest’s main objective is to validate interoperability, accelerate innovation, and foster vendor collaboration in O-RAN campus networks.

Testing: 29 September – 2 October 2025
Results Presentation: 14 October 2025 at the xG-ALOE Event
Results Publication: will be published afterwards
Event location: Lanolinfabrik | Event Space (ground floor), Salzufer 15/16, 10587 Berlin

Technical Test Areas

The Plugfest will address the latest innovations in O-RAN campus networks, focusing on end-to-end solutions that combine multiple test domains:

· O-RAN End-to-End Tests (O-RU, O-DU, O-CU, 5G Core)
· Time Sensitive Networking (TSN)
· Localization & Sensing
· Security Tests

Benefits of Participation

Participation in the xG-ALOE Plugfest offers:

· Collaboration with a diverse range of new and existing partners
· Preparation for potential campus badging or certification aligned with O-RAN specifications
· Extended test coverage, improved software quality, and more efficient development and testing cycles
· Access to xG-ALOE test reports, which document practical use cases and network designs for integration into real-world solutions
· Enhanced visibility through coordinated marketing and communication activities

Marketing & Dissemination

The outcomes of the Plugfest will be widely shared through:

· Official xG-ALOE reports and business media channels
· Press releases, blogs, and social media posts by xG-ALOE and participating organizations
· Targeted coverage on LinkedIn and other business platforms

How to Participate

· For key dates and detailed information, please review the Call for Participants.
· To express your interest, please email us at xG-ALOE-Plugfest@hhi.fraunhofer.de.